Used Semiconductor testers and system spares
Specialization in discrete component test systems for incoming inspection
& sampling
of small signal & high power transistors, diodes, fets, zeners, IGBTs,
SCRs, and triacs,
that test for breakdown voltage, current leakage, and most hi-rel test
parameters.
TESEC 881-TT/A with PC control....discrete
semiconductor test system:
includes one scanner station with head box...best offer.
Frothingham FEC Diode test systems...fully functional
RI-40
RI-51 Reedholm Parametric Test System spare boards
and
modules, VFIF-16, DMM, SMU, PPG, VF, SCM, CMM, CPM
TESEC 8102-LV INDUCTIVE LOAD TESTER...Fully
functional.
Coils, installation and training available.
Scientific Test 5300, STI 5150....systems, spare parts, fixtures
TESEC 881-TT/A SPECTRA DISCRETE
TEST SYSTEMS.
Contact for further details.
TESEC PT-9913A STATION I/F INTERFACE BOARD WITH CABLE
TESEC P8220B STATION I/F INTERFACE BOARD WITH CABLE
Spare
system boards for Tesec 881, 881-TT/A, and 8101
testers
LORLIN
...spares boards, test stations, for the Lorlin Impact 2, 3, 4,
and Dataspec test systems. Fully functional testers are available.
Specialization in discrete component test systems for incoming inspection
& sampling
of small signal & high power transistors, diodes, fets, zeners, IGBTs,
SCRs, and triacs,
that test for breakdown voltage, current leakage, and most hi-rel test
parameters.
Semiconductor testers are used in QC , Final Test, and incoming inspection
departments
to test discrete devices, for in-circuit test (ICT) of PCBs, integrated
circuits (ICs), LEDs,
hybrids, memory, discrete components, IGBT, mixed signal, linear, and
passive devices.
Tesec high voltage test station
8610-CU
Diode
Test Systems
email:
info@national-ate.com
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