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Reedholm
test system RI-40 24-Pin Parametric Test System with WLR
software and Capacitance Module, Vintage 2001 for
sale.
The Reedholm RI-40
provides fast and accurate measurement of
semiconductor device characteristics using high
accuracy force-measurement modules and a low-noise
switch matrix system. This system is ideal for
laboratory engineering work or for high volume data
collection. It includes 3 switch matrix cards (8
pins per card) for a total of 24 pins available for
DUT connectivity. It also includes 3 VFIF modules
which can force voltage (VF) or current (IF). A
fourth VF module provides a total of 4 supplies for
device power and measurement. A DMM-16 module
provides high accuracy digital multimeter
measurements across the entire switch matrix.
As configured and purchased new, this tool would
cost well over $150,000
Full operational demonstration is available.
Wafer Level Reliability (WLR) Test Software
Boonton Capacitance Measurement Module (CMM)
IEEE-488 Interface Option
EG Prober Interface Software
Standard Tester Features:
Digital Parametric Tester
Allows fast and easy measurement of any
semiconductor device parameter. Select from a
pre-defined suite of standard device measurements
for single point data collection or you can define
your own test with direct access through custom
software code written by the user to directly
control the hardware and measurements. Standard
tests include:
Resistance (2 or 4 terminal)
Voltage vs. Time @ defined Current
Current vs. Time @ defined Voltage
FET Measurements
Bipolar Measurements
Digital Curve Tracer
The RI-40 standard software also includes a digital
curve tracer package. This allows device
measurements to be made while other bias voltages
are swept in a pre-defined range. High flexibility
in the standard test suite allows almost any device
parameter to be measured and characterized. Rapidly
collect a FET device family-of-curves, measure Vt
using the point of maximum slope, and save these
results as a digital measurement result table for
future reference or plotting.
Included Tester Options:
WLR Software
The Reedholm WLR software allows for quick and easy
definition of industry standard WLR tests to
characterize process or device reliability at the
wafer level. Standard tests like SWEAT, TDDB, or
HCI allow characterization of metal, oxide, or
device reliability for process reliability
monitoring.
Boonton CMM
The Capacitance Measurement Module allows an added
level of oxide characterization by allowing you to
measure the actual capacitance of a device or test
structure. Using proper techniques, parasitic
capacitance in the cabling, probe card, and switch
matrix can be eliminated allowing for highly
accurate and resolute measurements.
IEEE-488 Interface Option
Interface additional equipment to this
system with the built-in software using
this firmware option. Interface a frequency counter
to measure ring oscillators, or other IEEE-488 equipment.
EG Prober Driver Software
Use the RI-40 as a manual mode parametric tester for
single device characterization or single site
characterization or use this software driver to
directly control an Electroglas prober. Additional
prober drivers can be purchased from the factory but
the EG one is already installed on this tool. This
allows the tester to directly control the prober and
test multiple sites and die on a wafer and even an
entire lot at one time. Networkability of the tool
then allows direct upload access to a database for
analysis and reporting.
View the
manufacturers specs:
http://www.reedholm.com/DataSheet/DS10025.pdf
CONTACT via phone: 508-881-6863 or email:
Sales@national-ate.com
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NATIONAL A.T.E.
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