Prometrix RS-55 TC wafer mapping system, working and excellent condition. 
Monitor, computer, test unit, 2 hard drive cartridges, maintenance manual,
printer, comm box, 3 reference standards.   RS55/tc    Fully functional.
Measures single or multiple layers or oxide, nitride, photoresist, polysilican
and optical transparent films. Measurement capabilities from 100 angstrom to
greater that 4 microns. Analysis capabilities: mapping: die, contour, 3-D maps
wafer handling, Measurement: Film thickness, reflexivity. Spot sizes: 4um to 80um.
Number of layers: Up to 3.  Standard wafer sizes: 3, 3.25" and 100, 125, 150,

   
 

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