We buy & sell Lorlin Test Systems, spares & options

 The standard Lorlin Impact Test System is capable of testing Transistors, Diodes, and
 FET's. The tester has three pin capability; Emitter, Base, and Collector, which have true
 Kelvin connections up to the test fixture. The standard Mainframe can have up to three
 Test Stations and optionally five (5).

Standard specifications are:

Leakage Tests
Voltage Source - 1.000 V - 600.0 V
Current Meas. - 100.0pA - 200.0mA

Voltage Breakdown Tests
Current Source - 1.000uA - 1.000 A
Voltage Meas. - 100.0mV - 600.0 V

ON Tests
Base Current - 10.00uA - 20.00 A
Collector Current - 10.00uA - 20.00 A
Voltage Meas. - 1.000mV - 15.00 V

Options to the standard Impact Tester:

AC Option - Adds capability for 1.0kHz AC tests (Plugs into Mainframe Test Chassis)

SCR Option - Adds capability for SCR and TRIAC tests (Plugs into Mainframe Chassis)

VX Option - Adds capability for testing Power FET's needing a Gate voltage greater
than 20V ( small boards plug into both the Power Supply and Test Chassis )

HCM-201 - Increases the Collector Current to 200.0A (an additional chassis in
Mainframe and an OTS-201 Test Station is required to utilize full Amperage range)

HVS-201 - Increases the Voltage Source to 2kV 2000 volts (additional chassis in
Mainframe and a OTS-201 Test Station is required to utilize full Voltage range)

SS-100 - Test Station capable of testing multi-device packages (arrays). Can test one
device up to a maximum of ten 3 leaded devices with one pass.  Each Relay Board
(device) can transfer up to 600.0V or 20.00A maximum.

SS-150 - FET Test Station capable of testing multi-device packages (arrays).  Can test
one device up to a maximum of ten 3 leaded devices with one pass.  Each Relay Board (device) can transfer up to 600.0V or 2.000A maximum.  Increases the Current Measuring range to include 1.000pA - 100.0pA

SEU-100 - System Expansion Unit increases the maximum test Stations from 3 to 5.
(additional chassis in the Mainframe).

All of the options above are easily added now or on-site later, except
additional chassis need for the SEU-100.

The Lorlin Software Application includes the capability of all these options.

All Test Stations, except the SS series, have a seven pin banana jack pattern to
connect customer test fixtures. There are 2 Collector (force and sense), 2 Base
(force and sense), 2 Emitter (force and sense), and 1 Ground.


 Available now: Lorlin Double Impact discrete component tester, 
 fully functional, PC control, with 600 Volt 20 Amp test capability.

 LORLIN ...spares boards, test stations, for the Lorlin Impact 2, 3, 4, i500
 and Dataspec test systems.  Fully functional guaranteed testers available

 HV component, Power FET, Computer I/F, D/A Board, Constant current,
 Constant current with V clamp, Bias resistor, and configuration boards

 Warranty.......Guarantee........Upgrades.........Maintenance........

 OTS-300 High current manual station up to 500 amp capability
 OTS-201 High voltage manual test station (2000 volts)

 We offer power semiconductor testing up to 2000 Volts and 500 Amps

 High Voltage Board, Configuration Board, SCR option board, HPTS-50,
 station logic, station relay, SS-100 stations, SS-150 stations

 Lorlin spare boards:  PS Comparator, 30V Regulator, 5V Regulator, HV Component,
 Power FET, D/A, 30A Constant Current, Constant Current with V-clamp, Bias Resistor,
 High Voltage, Configuration, SCR Option, HPTS-50, Station Logic, all available.
 
CONTACT via email: sales@national-ate.com
 
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