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Buy or Sell  JEOL, Hitachi SEMs, FEI, and pre-owned Philips TEMs, 
  FE-SEM, FIB, ion beam microscopy systems, field emission FEM
  and transmission electron microscopes for sale.

  Most tools are " for sale " directly from the actual owner, some have demo available,
  most have been under continuous OEM maintenance contracts and offer the ability
  for you to SAVE tens of thousands of dollars from all the expensive " refurbishers ".

  
   Updated January 4, 2012

  

 
For systems that have been de-installed or warehoused, we can offer a base-line
  guaranteed functional installation or a fair price refurbished system....with warranty.

 

- FEI 120 kV Transmission Electron Microscope (TEM)

- FEI XL30, FEI / Philips XL40 DX4 SEM

- Hitachi S-4500 SEM, Hitachi S-4500 Type 2
- Hitachi S-4700 SEM  WANTED, Hitachi S-4700

 
Zeiss 1540XB, focused ion beam, with EDS ...latest technology.
 
Field emission type scanning electron microscope with x-ray and EBSD detectors 
  for material analysis. Focused ion beam high precision deposition of tungsten, titanium,
  and silicon dioxide.


- JEOL JSM-840 SEM, Hitachi S-5000 FEG SEM
- Hitachi S-6100 SEM, Hitachi S-8620 SEM, 8"
` Hitachi S-8820 SEM, 8" , Hitachi S-9300 SEM, 8"
- JEOL 6KV SEM, JEOL JSM-6600F, JEOL JSM-6360LV WANTED

  JEOL 6390 Scanning Electron Microscope, Resolution: 3.0nm (at 30kV and
  8mm WD), Magnification: 5X to 300,000X (163 steps), computer, MP-01010(XY)
  Motorized X and Y axes LGS stage, MP-34470(BEIW) Backscattering Electron
  Detector, R033SP/W Water recirculator, GW-IRCS-PIP GW IF chamberscope
  can be use for imaging samples with Wet SEM technology...SOLD

 
Hitachi SEM model S-570 w/ Lab6 gun

 
Sell your SEM here........ this page is one of highest rated Google "Used Sem"
  sites in the world and offers tremendous exposure for your surplus system.


  Amray SEM with Energy Dispersive X-Ray Spectrometer
  Hitachi S4500 SEM, demo and pictures available
.
 
 
HITACHI S-3500N SEM, was working when de-installed, includes PC
 
 
Joel JSM-6340F Field Emission Scanning Electron Microscope with Oxford
  model 7158 INCA Microanalysis system, Jeol Stage Controller & PC, monitor,
  HP Vectra Pentium 3 CPU, Windows NT 98, HP laser printer, Exela Cool Ace
  model CA-2500 Cooling Unit, large chamber.

 
For systems that have been de-installed, crated, or warehoused, we can offer.....
  at additional cost, either a base-line functional installation, or a fair priced full
  refurbishment, upgrades and install, with warranty on most models.

  
  JEOL 6335F FESEM, vintage 2002, JSM-6335F is a high resolution
  conventional Field Emission Scanning Electron Microscope.  Tool
  is pristine due to very little use, contact for full details. 
  
  JEOL JSM-5400 with Noran Voyager EDS (1997) and

  
available for operational demonstration, $45,000

  Technical sales solutions are available here...........
  ++++++++++++++++++++++++++++++++++++++++++++++++++++++++
  
  
  
All products listed are subject to prior sale.
  

  
Please send an email to offer your surplus assets.
   

  Please contact for further information regarding this laboratory instrumentation.
  
CONTACT via phone: 508-598-7334 or email: Sales@national-ate.com
  
  
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  No part of this web page may be copied, duplicated, or transmitted by any means
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