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HI-REL Discrete component testing, low cost & affordable, test lab, HI REL
diode, transistor, SCR, Triacs and high power semiconductor test, ISO, pre,
post burn-in screening of semiconductor devices.  High reliability test house.

We have the equipment, knowledge, expertise, and capability to test ANY
discrete component device for HALF the cost of ANY other discrete device
test house.  We offer complete Hirel data & statistical analysis.

Full details at:  www.national-ate.com/discrete.htm

We also broker, buy and sell, excellent quality, surplus, new, used and pre-owned
component test systems, semiconductor testers, IC test systems, SEMs, semiconductor
production equipment, probers, temperature forcing systems, and In-Circuit testers (ICT).

We can intelligently discuss your needs or offer of new, used or surplus equipment, in the
areas of component test, semiconductor test, IC sort, wafer probe, bond, inspection, final
test, QC, and In-Circuit (ICT) testers.

Our many years of sales experience in marketing semiconductor related equipment, can
& will assist you to find, buy, or sell, excess or surplus equipment through our extensive
knowledge of equipment buyers, sellers, dealers, and those with equipment for sale.

Contact today by email: Info@NATIONAL-ATE.com or phone: 508-598-7334

All product names and trademarks listed herein are the property of their respective holders. No part of this web page
may be copied, duplicated, or transmitted by any means mechanical or electronic, without the written permission of NATIONAL A.T.E.  ALL equipment listed within is subject to prior sale. Copyright © 1997-2008  All Rights Reserved.